TTTC's Electronic Broadcasting Service

CALL FOR PARTICIPATION

Program

Thursday, Oct 23rd

5:00pm � Opening Remarks
Arani Sinha (Intel), General Chair DATA-2014,
Jeffrey Roehr (Texas Instruments), Program Chair DATA-2014

5:15-6:00 Keynote Talk: Machine Learning Unraveled
Mark Fetherolf (Numinary Data Science)

6:00-7:00 Posters&Tables
Optimal Plus, Galaxy, CAST team, KLA-Tencor, Qualtera

7:00-9:00 Beer and Wine Reception
Both ITC workshops together

Friday, Oct 24th

8:00-8:45 Invited Talk: Potential of Adaptive Testing for Addressing Cost of Test Crisis
Wojciech Maly (Carnegie Mellon University)

8:45-9:05 Big Data Analysis in the Age of IoT
Steve Griffith (Syntricity Inc.)

9:05-9:25 Practical Issues With Selecting & Applying Outlier Methods
Peter O�Neill (Avago Technologies), Donald W. Hartman
(TestCIM Consulting and Salland Engineering)

9:25-9:45 Learning from Chips Behaving Badly
Harry Chen (MediaTek Inc.), Shih-Hua Kuo (National Chiao Tung University),
Jonathan Tung (MediaTek Inc.), Mango C.-T. Chao (National Chiao Tung University)

9:45-10:30 Invited Talk: Big Data, Big Challenges: Ownership, Security and Quality
Robert Aitken (ARM)

10:30-11:00 Break

11:00-11:30 Data Base initiatives for the future of Test
Mark Roos (Roos Instruments)

11:30-12:00 Intro to RITdb - Comprehensive Standards to support Monitoring, Analysis and
Adaptive Test
Stacy Ajouri (Texas Instruments)

12:00-1:00 Lunch

1:00-1:30 Deployment of Custom Algorithms for Very High-Volume Quality Control,
Yield Diagnostics, and Equipment Monitoring
Dirk K. de Vries (Qualtera), Lam Ta (Freescale Semiconductor),
Dave Kolar (Freescale Semiconductor), Paul Simon (Qualtera)

1:30-2:00 Automatic assessment of test bimodality for outlier detection application
Ivan Filer (Optimal Plus)

2:00-2:30 Improving traditional PAT by the use of Multivariate data
Nicolas LeBlond (Galaxy), Jochen Matthias Stefan (Micronas GmbH),
J�r�me Kodjabachian (Galaxy)

2:30-3:00 Break

3:00-4:00 Panel: Volume diagnosis in the foundry-fabless eco system
Moderator: Geir Eide (Mentor Graphics)

Registration

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Registration is possible through the ITC registration page: http://www.itctestweek.org/register

Contact Information

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Technical Program Submissions:

Jeffrey Roehr

Texas Instruments, USA.

E-mail: JLRoehr@TI.com

General Information:

Arani Sinha

Intel, USA.

E-mail: Arani.Sinha@INTEL.com

Committee

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PROGRAM CHAIR

Jeffrey Roehr, Texas Instruments

GENERAL CHAIR

Arani Sinha, Intel

VICE-PROGRAM CHAIR

Jennifer Dworak, SMU

FINANCE CHAIR

Sankaran Menon, Intel

PUBLICITY CHAIR

Kanad Chakraborty, Lattice Semi

PANEL CHAIR

Wesley Smith, Galaxy

PUBLICATIONS CHAIR

Chintan Patel, UMBC

EU LIAISON

Paul Simon, Qualtera

TEST STANDARDS CHAIR

Al Crouch, Asset-Intertech

LOCAL ARRANGEMENTS CHAIR

David Park, Optimal Plus

STEERING COMMITTEE

Sankaran Menon, Intel
Adit Singh, Auburn Univ.
M. Tehranipoor, U Connecticut
Hank Walker, Texas A&M
Hans Manhaeve, Q-Star Test
Jim Plusquellic, U. New Mexico

PROGRAM COMMITTEE

Rob Aitken, ARM
Nemat Bidokhti, Cisco
Sreejit Chakravarty, LSI
Patrick Girard, LIRMM, France
Ajay Khoche, Consultant
Mike Laisne, Qualcomm
Amit Nahar, TI
Suriyaprakash Natarajan, Intel
Jay Orbon, Consultant
John Potter, Asset-Intertech
Rajesh Raina, Freescale
Claude Thibeault, ETS, Canada
Li C. Wang, UCSB
Xiaoqing Wen, KIT, Japan
Qiang Xu, CUHK, Hong Kong

For more information, visit us on the web at: http://DATA.tttc-events.org/

The IEEE International Workshop on Defects, Adaptive Test and Data Analysis 2014 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).